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Name of the Research Topic

Industrial Metrology

“Fundamental and Applied Metrology”

Description:

Create, implement and/or improve the measurement processes for scientific and technological application, that guarantee of compliance for its intended purpose.

Subtopics or Sub-lines of investigation:

  • Nanometrology
  • Micro and nanomaterials applications
  • Synthesis and characterization
  • Optoelectronics and magnetics nanostructures
  • Biocomposites
  • Alternative Energies
  • Fuels
  • Sources
  • Production supervision and optimization of processes through metrology
  • Metrology engineering for environmental applications
  • Design and development of measurement systems
  • Legal Metrology
  • Metrology Education

Name of the Academic Bodies and/or investigation groups relevant to the line of investigation:

Chemical and Materials Metrology. Consolidated Academic Body

Development of avant-guard strategies in the teaching-learning processes of metrology

Participating Professors:

  • Mercader Trejo Flora E.
  • Zapata Campos Edith.
  • Díaz Jiménez Julio César.
  • Luyo Alvarado Saúl Javier.
  • Herrera Basurto Raúl.
  • Rodríguez López Aarón.

Operation Start Date:

1st of April of 2013.

Objective of the Group of Investigation:

Innovate measurement systems with scientific and industrial applications, whilst applying theoretical-experimental methodologies in measurement science.